Seminar: "X-ray diffraction for geological applications"

 

Presenter: 

Jonathan W. Mies
UC Foundation Associate Professor of Geology
The University of Tennessee at Chattanooga

 

Date and time: Wednesday, November 2, 1-1:50 p.m., Grote 318

 

Abstract

 

Just as light is diffracted by a grating of appropriately spaced slits,
X-rays are diffracted by rows and planes of closely spaced atoms in a
crystal. With powder X-ray diffraction, dimensions in the crystal lattice
are measured to several thousandths of an angstrom. These dimensions,
considered collectively, provide a finger-print-like identification and
characterization of minerals and other crystalline substances. The technique
has obvious applications in geology, for the study of minerals, but is also
used in other sciences, e.g. forensic science, material science, physics,
and chemistry, and in a variety of industries, e.g. paints, ceramics, and
pharmaceuticals.

The geology program upgraded its X-ray diffractometer to an essentially new
instrument, which was commissioned in June of 2001. The project was funded
by the National Science Foundation (NSF DUE-9952345) and UTC's Center of
Excellence for Computer Applications (CECA). The instrument is used in the
geology program for purposes of instruction and research.

 

Faculty, staff and students are invited.